发明名称
摘要 A method of forming a dielectric thin film pattern, comprises the steps of: depositing a dielectric thin film on a substrate having a resist pattern thereon by a vapor deposition method, wherein as a material for the dielectric thin film, at least one of CeO2, Sm2O3, Dy2O3, Y2O3 TiO2, Al2O3, and MgO is used; and removing the resist pattern whereby the dielectric thin film is patterned. A conductive film may additionally be provided on the dielectric film prior to the patterning step. <IMAGE>
申请公布号 KR100442700(B1) 申请公布日期 2004.08.02
申请号 KR19990052686 申请日期 1999.11.25
申请人 发明人
分类号 H01L21/027;H05K3/46;H01L21/02;H01L21/302;H01L21/3065;H01L21/316;H01P3/16;H05K1/02;H05K3/04 主分类号 H01L21/027
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