| 摘要 |
PURPOSE: A semiconductor IC and a test system for testing an interface part of the same are provided to test the interface part with high accuracy of timing as well as a test system for performing such a test. CONSTITUTION: A semiconductor IC includes a pin part(8), internal circuit(2-6), an interface part(7), an expectation value generation circuit(11), a comparison circuit(12), and a waveform generation circuit(13). The pin part includes a plurality of pins. The interface part is used for producing operation signals for operating the internal circuits and outputting read data to the outside through the pin part. At a first test mode, the expectation value generation circuit generates an expectation value of the operation signal of the interface part according to a first test signal. At this time, the comparison circuit outputs a compared result between the operation signal and the expectation value of the operation signal. At a second mode, the waveform generation circuit supplies a second test signal to the interface part. At this time, the interface part outputs test output signals having the same waveform to the outside.
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