发明名称 |
WAFER TRANSFER APPARATUS WITH SENSING CAPACITY OF WAFER SLIDING |
摘要 |
PURPOSE: A wafer transfer apparatus with sensing capacity of wafer sliding is provided to prevent a wafer from being damaged by installing a detection unit in a wafer transfer apparatus and by stopping the wafer transfer apparatus when the wafer slides. CONSTITUTION: A guide block(51) transfers horizontally and vertically and rotates. A transfer body(52) simultaneously performs a vertical transfer and a rotational transfer, mounted on the guide block. A plurality of tweezers(53) hold the wafer(W), installed in a side of the transfer body. A detection unit(54) detects the sliding of the wafer, installed in a side of the guide block.
|
申请公布号 |
KR20040067725(A) |
申请公布日期 |
2004.07.30 |
申请号 |
KR20030004959 |
申请日期 |
2003.01.24 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
LIM, YEONG CHEOL |
分类号 |
H01L21/68;(IPC1-7):H01L21/68 |
主分类号 |
H01L21/68 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|