发明名称 METHOD FOR FABRICATING TIP OF ELECTRIC CONTACTOR FOR INSPECTING ELECTRONIC ELEMENT
摘要 PURPOSE: A method for fabricating a tip of an electric contactor for inspecting an electronic element is provided to form a tip having a sharp end by performing a MEMS(Micro Electro Mechanical System) process. CONSTITUTION: A protective layer pattern is formed on a sacrificial silicon substrate in order to a tip forming region. The first anisotropic etch process is performed by using the protective layer pattern as an etch mask. A trench is formed on the sacrificial silicon substrate. The protective layer pattern is removed from a peripheral part of the trench. The width of the upper part of the trench is increased and the upper end of the trench is sharpened by performing the anisotropic etch process for the trench. The trench is buried by a conductive material. A tip(24) is formed by removing the protective layer pattern and the sacrificial silicon substrate.
申请公布号 KR20040067526(A) 申请公布日期 2004.07.30
申请号 KR20030004675 申请日期 2003.01.24
申请人 LEE, UK KI;PHICOM CORP. 发明人 KIM, JONG SAM;LEE, JEONG BAE
分类号 H01L21/66;(IPC1-7):H01L21/66 主分类号 H01L21/66
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