发明名称 |
MANUFACTURING METHOD FOR SEMICONDUCTOR DEVICE, SEMICONDUCTOR DEVICE, AND ELECTRONIC EQUIPMENT |
摘要 |
PROBLEM TO BE SOLVED: To provide a package by which a chip can be thinned remarkably without a back grinding treatment resulting in a crack and a grinding trace, the chip can be manufactured at a lower cost in a higher throughput and the dispersion of the thickness of the chip can be inhibited; and to provide its manufacturing method. SOLUTION: A semiconductor film as a thin-film having a film thickness of≤500 nm formed on a substrate functioning as a supporter is crystallized by a laser beam in continuous oscillation, and the chip with a semiconductor element as the thin-film of the total film thickness of 5μm, more desirably≤2μm is formed by using the crystallized semiconductor film. The chip is mounted on an interposer under the state in which the substrate is peeled finally. COPYRIGHT: (C)2004,JPO&NCIPI
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申请公布号 |
JP2004214635(A) |
申请公布日期 |
2004.07.29 |
申请号 |
JP20030411870 |
申请日期 |
2003.12.10 |
申请人 |
SEMICONDUCTOR ENERGY LAB CO LTD |
发明人 |
YAMAZAKI SHUNPEI;TAKAYAMA TORU;MARUYAMA JUNYA;ONO YUMIKO;TANAKA KOICHIRO |
分类号 |
H01L23/12;H01L21/02;H01L21/20;H01L21/268;H01L21/336;H01L25/065;H01L25/07;H01L25/18;H01L27/12;H01L29/786;(IPC1-7):H01L23/12 |
主分类号 |
H01L23/12 |
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