发明名称 CONTACT PIN PAIR FOR FOUR-PROBE MEASUREMENT, AND CONTACT APPARATUS
摘要 PROBLEM TO BE SOLVED: To reduce the number of component items of a contact member for four-probe measurement, to simplify the structure, and to lower the price of a contact apparatus using the contact member. SOLUTION: A contact pin pair for four-probe measurement 2 has contact ends 16, 16 at the both ends thereof as the contact member for four-probe measurement. The one contact end 16 comprises two adjacent contact pins 6v, 6i which are in contact with an electrode 38 while being isolated from each other. Two electric pathways are provided which are the one running from one end of the contact pin 6v to the other end thereof and the one running from one end of the contact pin 6i to the other end thereof. Each contact pin 6v, 6i comprises, for example, two terminals 12, 12 and a conductive spring 14 provided compressedly therebetween, respectively. COPYRIGHT: (C)2004,JPO&NCIPI
申请公布号 JP2004212233(A) 申请公布日期 2004.07.29
申请号 JP20030000020 申请日期 2003.01.06
申请人 TOYO DENSHI GIKEN KK 发明人 SHIBUI YUKIMORI
分类号 G01R1/073;G01R1/067;G01R31/28;(IPC1-7):G01R1/073 主分类号 G01R1/073
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