发明名称 APPARATUS AND METHOD FOR PROCESSING SUBSTRATE
摘要 PROBLEM TO BE SOLVED: To provide an apparatus and a method for processing a substrate which can wash well the periphery of the substrate. SOLUTION: The wafer holding device 6 includes six holding rollers 13 and 33. The holding rollers 13 and 33 are arranged on the circumference corresponding to the shape of the end face of a wafer W, which is held with its end face being abutting to the side surfaces of the holding rollers 13 and 33. The holding rollers 13 and 33 are pivotally provided to base parts 12 and 32 in order to rotate the wafer W with the wafer W being hold. Second feeding nozzles of washing solution for feeding a solution to remove slurry from the peripheries of the upper and lower surfaces of the wafer W and to etch an unnecessary thin film of the peripheries are provided to the peripheries. COPYRIGHT: (C)2004,JPO&NCIPI
申请公布号 JP2004214695(A) 申请公布日期 2004.07.29
申请号 JP20040082008 申请日期 2004.03.22
申请人 DAINIPPON SCREEN MFG CO LTD 发明人 OKAMOTO TADAO
分类号 H01L21/306;H01L21/304;(IPC1-7):H01L21/304 主分类号 H01L21/306
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