Test fixture for die-level testing of planar lightwave circuits

摘要

A test fixture is used for testing a hybrid planar lightwave circuit having both electrical and optical inputs and/or outputs. The test fixture comprises a vacuum interface for holding the hybrid planar lightwave circuit in place. The test fixture comprises a mounting area for a circuit board that has a first interface to connect to the hybrid planar lightwave circuit and a second interface to connect to a tester.