发明名称 Method of designing a thermal physical vapor deposition system
摘要 The need is met according to the present invention by providing a method of designing a system for thermal vapor deposition that includes a material to be deposited on a workpiece, an elongated container for containing the material, a heater for heating the material in the container to vaporize the material, the container defining n apertures for emitting the vaporized material in an elongated pattern in the elongated direction, that includes the steps of: calculating the total source throughput Q per unit length at a deposition rate of interest; calculating the internal pressure P of the source required to produce Q for the total aperture conductance CA of the source; modeling the system as a ladder network of conductances, the elongated container having a container conductance CB and conductances Cb=nCB, between apertures, and the apertures having a combined conductance <math-cwu id="MATH-US-00001"> <NUMBER>1</NUMBER> <MATH> <MROW> <MROW> <MSUB> <MI>C</MI> <MI>A</MI> </MSUB> <MO>=</MO> <MROW> <MUNDEROVER> <MO>∑</MO> <MROW> <MI>i</MI> <MO>=</MO> <MN>1</MN> </MROW> <MI>n</MI> </MUNDEROVER> <MO>⁢</MO> <MSTYLE> <MTEXT> </MTEXT> </MSTYLE> <MO>⁢</MO> <MSUB> <MI>C</MI> <MI>ai</MI> </MSUB> </MROW> </MROW> <MO>,</MO> </MROW> </MATH> <mathematica-file id="MATHEMATICA-00001" file="US20040144321A1-20040729-M00001.NB"/> <image id="EMI-M00001" wi="216.027" he="24.01245" file="US20040144321A1-20040729-M00001.TIF" imf="TIFF" ti="MF"/> </MATH-CWU> where Cai are individual aperture conductances; and using the latter network model, designing the system to have a desired pressure uniformity along the elongated direction of the container.
申请公布号 US2004144321(A1) 申请公布日期 2004.07.29
申请号 US20030352558 申请日期 2003.01.28
申请人 EASTMAN KODAK COMPANY 发明人 GRACE JEREMY M.;FREEMAN DENNIS R.;REDDEN NEIL;KLUG JUSTIN H.;VAN SLYKE STEVEN A.
分类号 H05B33/10;C23C14/12;C23C14/24;H01L51/50;(IPC1-7):C23C16/00 主分类号 H05B33/10
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