发明名称 INSPECTION METHOD AND INSPECTION DEVICE FOR SPACER
摘要 PROBLEM TO BE SOLVED: To provide an inspection method and an inspection device capable of easily and accurately inspecting the arrangement state of spacers. SOLUTION: In inspecting the arrangement state of the plurality of spacers arranged on a setting face, an inspection light is radiated tward the spacers 30a by a light source in a direction slanted by 0 to 20 degrees against the setting face, and scattered light scattered by the spacers is imaged by an imaging device 54 fitted against the setting face to inspect the arrangement state of the spacer by an image obtained. COPYRIGHT: (C)2004,JPO&NCIPI
申请公布号 JP2004214147(A) 申请公布日期 2004.07.29
申请号 JP20030002321 申请日期 2003.01.08
申请人 TOSHIBA CORP 发明人 KAWABATA SHUNICHI;MARUYAMA JUNYA
分类号 G01M11/00;H01J9/24;H01J9/42;(IPC1-7):H01J9/42 主分类号 G01M11/00
代理机构 代理人
主权项
地址