发明名称 METHOD AND APPARATUS FOR AVOIDING GATED DIODE BREAKDOWN IN TRANSISTOR CIRCUITS
摘要 <p>An N-channel transistor protection circuit and method are disclosed that prevent gated diode breakdown in N-channel transistors that have a high voltage on their drain. The disclosed N-channel protection circuit may be switched in a high voltage mode between a high voltage level and a lower rail voltage. A high voltage conversion circuit prevents gated diode breakdown in N-channel transistors by dividing the high voltage across two N-channel transistors, MXU0 and MXU1, such that no transistor exceeds the breakdown voltage, Vbreakdown. An intermediate voltage drives the top N-channel transistor, MXU0. The top N-channel transistor, MXU0, is gated with a voltage level that is at least one N-channel threshold, Vtn, below the high voltage level, Vep, using the intermediate voltage level, nprot. The drain voltage of MXU0 will be at least one N-channel threshold, Vtn, lower than the input voltage level, nprot, and the drain voltage Vd of the bottom N-channel transistor, MXU1, is limited to less than the breakdown voltage, Vbreakdown.</p>
申请公布号 WO2004064253(A1) 申请公布日期 2004.07.29
申请号 WO2003US41594 申请日期 2003.12.29
申请人 ADVANCED TECHNOLOGY MATERIALS, INC. 发明人 HOLLMER, SHANE, C.
分类号 H01L27/02;H03K3/00;H03L5/00;(IPC1-7):H03K3/00 主分类号 H01L27/02
代理机构 代理人
主权项
地址