| 摘要 |
PROBLEM TO BE SOLVED: To efficiently perform the sampling of measurement data on a material test. SOLUTION: Sampling is performed on load data and displacement data at low speeds and at high speeds on a testing machine body 100 side. Low-speed sampled data are transmitted to a data processor 200 at prescribed time intervals and stored in a RAM 203. High-speed sampled data are temporarily stored in a ring buffer 110. When an instruction to collect data is issued from an instruction button 111, from among data stored in the ring buffer 110, data of a prescribed time period before and the subsequent data are read out in order for a prescribed term and stored in a memory card 108. After testing is terminated, high-speed sampled data stored in the memory card 108 are transmitted to the data processor 200 and the data processor 200 synthesizes the low-speed and high-speed sampled data. COPYRIGHT: (C)2004,JPO&NCIPI
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