发明名称 |
Semiconductor wafer processing apparatus |
摘要 |
A photolithography apparatus includes: an air supply line supplying an air to a chamber processing a wafer; a temperature and humidity adjuster provided to the air supply line; a temperature and humidity monitoring sensor sensing temperature and humidity internal to the chamber; and a controller connected to the temperature and humidity monitoring sensor and the temperature and humidity adjuster to control the temperature and humidity adjuster to supply the chamber via the air supply line with an air having the same temperature and humidity as those of the air in the chamber detected by the temperature and humidity monitoring sensor.
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申请公布号 |
US2004144488(A1) |
申请公布日期 |
2004.07.29 |
申请号 |
US20030632953 |
申请日期 |
2003.08.04 |
申请人 |
RENESAS TECH CORP |
发明人 |
SHOYA TAKAYUKI;NAGANO MASARU |
分类号 |
H01L21/027;G03F7/20;(IPC1-7):H01L21/306 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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