发明名称 SEMICONDUCTOR SUBSTRATE AND ITS MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor substrate which can fully play its element function, has a thick insulator layer realizing enough strength, hardly generates warp of a substrate, crystal defect and dislocation and can realize a circuit of high integration degree, and its manufacturing method. SOLUTION: The semiconductor substrate is used for a semiconductor device wherein a passive element 5 is disposed on an insulator and active elements Q1, Q2 are built. A thermal oxide layer 2 which is at least 10μm thick is formed in a portion (A1) wherein the passive element 5 is disposed, and a groove 3 which is filled with polycrystalline silicon 4 is formed in the inside from an outer circumferential surface 2a of the thermal oxide layer 2 along the outer circumferential surface 2a. COPYRIGHT: (C)2004,JPO&NCIPI
申请公布号 JP2004214596(A) 申请公布日期 2004.07.29
申请号 JP20030159888 申请日期 2003.06.04
申请人 DENSO CORP 发明人 TSURUTA KAZUHIRO
分类号 H01L21/76;H01L21/762;H01L21/763;H01L21/822;H01L21/8234;H01L27/04;H01L27/06;H01L27/08;H01L27/12;(IPC1-7):H01L21/76;H01L21/823 主分类号 H01L21/76
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