发明名称 METHOD FOR CARRYING OUT QUALITY CONTROL ON AN ANALYTICAL PROCESS AND DEVICE FOR CARRYING OUT SAID METHOD
摘要 The invention relates to a method for carrying out quality control on an analytical process which belongs to a group of related analytical processes that can be executed in at least one analytical device and comprises a respective chain of sub-processes. Said method is characterised as follows: fundamental chemical and/or physical underlying sub-processes are stored for the group in a first database; at least one section of the chain of the analytical process is emulated by the specification of one of the underlying sub-processes for each sub-process in a section of the chain, using at least one control parameter and at least one corresponding threshold value; measured values are determined for the control parameters for at least one run of the analytical process and the measured values are compared with the corresponding threshold values for the quality control procedure.
申请公布号 WO2004046993(A3) 申请公布日期 2004.07.29
申请号 WO2003EP11712 申请日期 2003.10.22
申请人 SIEMENS AKTIENGESELLSCHAFT;ABRAHAM-FUCHS, KLAUS;MORITZ, MICHAEL 发明人 ABRAHAM-FUCHS, KLAUS;MORITZ, MICHAEL
分类号 G06F19/00 主分类号 G06F19/00
代理机构 代理人
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