发明名称 Precision microscope, e.g. for industrial measurement applications, has a detector-side correction lens (6) for correction of optical defects in an objective
摘要 Microscope precision optical measurement arrangement comprises an objective assembly (1) with at least a microscope objective (2) together with a detection unit (4) for recording the microscope image. At a short distance from the detector surface (4.1) is a correction lens (6) for correction of image errors over a first image field area that arise from optical imperfections in the objective lens. An Independent claim is made for a method of manufacture of an optical measurement arrangement for precise measurement applications.
申请公布号 DE10301336(A1) 申请公布日期 2004.07.29
申请号 DE20031001336 申请日期 2003.01.15
申请人 CARL ZEISS 发明人 BRATTKE, SIMON
分类号 G02B21/02;(IPC1-7):G02B21/02;G01B9/04;G01J1/04 主分类号 G02B21/02
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