发明名称 |
Precision microscope, e.g. for industrial measurement applications, has a detector-side correction lens (6) for correction of optical defects in an objective |
摘要 |
Microscope precision optical measurement arrangement comprises an objective assembly (1) with at least a microscope objective (2) together with a detection unit (4) for recording the microscope image. At a short distance from the detector surface (4.1) is a correction lens (6) for correction of image errors over a first image field area that arise from optical imperfections in the objective lens. An Independent claim is made for a method of manufacture of an optical measurement arrangement for precise measurement applications.
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申请公布号 |
DE10301336(A1) |
申请公布日期 |
2004.07.29 |
申请号 |
DE20031001336 |
申请日期 |
2003.01.15 |
申请人 |
CARL ZEISS |
发明人 |
BRATTKE, SIMON |
分类号 |
G02B21/02;(IPC1-7):G02B21/02;G01B9/04;G01J1/04 |
主分类号 |
G02B21/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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