发明名称 ELECTRON BEAM DEVICE AND METHOD FOR MANUFACTURING SAMPLE CHAMBER CONTAINER OF ELECTRON BEAM DEVICE
摘要 PROBLEM TO BE SOLVED: To provide an electron beam device, having a shielding performance of environmental magnetic field. SOLUTION: The electron beam device comprises a mirror cylinder for housing a magnetic field lens for collecting electron beam to a sample, and a sample chamber container for housing the sample. A non-magnetic and conductive material is used as a material of at least one of the mirror cylinder and the sample chamber container body. The material of the mirror cylinder or the sample chamber container body is an aluminum alloy with a side wall thickness of 10 mm or higher. A magnetic material with a thickness less than that of the side wall of the mirror cylinder or the sample chamber container body is provided on the inside of the side wall of the mirror cylinder or the sample chamber container body. COPYRIGHT: (C)2004,JPO&NCIPI
申请公布号 JP2004214110(A) 申请公布日期 2004.07.29
申请号 JP20030001684 申请日期 2003.01.08
申请人 HITACHI HIGH-TECHNOLOGIES CORP 发明人 INANOBE TAKESHI;TAKAMI TAKASHI;OSE YOICHI;SASADA KATSUHIRO
分类号 H01J37/16;(IPC1-7):H01J37/16 主分类号 H01J37/16
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