发明名称 METHOD FOR EVALUATING SUPERCONDUCTIVITY PROPERTY OF SUPERCONDUCTIVE FILM
摘要 PROBLEM TO BE SOLVED: To provide a method for sensitively, conveniently and inexpensively evaluating a superconductive film. SOLUTION: The superconductive film 1 is fixed to a scale 2. A cooling medium 4 is placed in a container 3. The superconductive film 1 is cooled and comes into a superconductive state. While a magnet 5 gradually falls, the scale 2 measures a force applied to the superconductive film 1. A distance Z between the superconductive film 1 and the magnet 5 is measured when a repulsive force changes to an attractive force. When magnetic field strength applied to the superconductive film 1 reaches a lower critical magnetic field H<SB>c1</SB>, a magnetic flux enters into the superconductive film 1. When the magnetic flux enters the superconductive film 1, the attractive force acts on the superconductive film 1 and the magnet 5. The superconductive film with an excellent superconductive property has the small distance Z. COPYRIGHT: (C)2004,JPO&NCIPI
申请公布号 JP2004212168(A) 申请公布日期 2004.07.29
申请号 JP20020381028 申请日期 2002.12.27
申请人 NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL & TECHNOLOGY;JAPAN SCIENCE & TECHNOLOGY AGENCY 发明人 ATHINARAYANAN SUNDARESAN;TANAKA KOSUKE;OSHIMA SHIGETOSHI;KUSUNOKI MASANOBU
分类号 G01R33/12;G01N27/72;H01B12/06;H01B13/00;H01L39/00;(IPC1-7):G01N27/72 主分类号 G01R33/12
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