发明名称 |
METHOD FOR EVALUATING SUPERCONDUCTIVITY PROPERTY OF SUPERCONDUCTIVE FILM |
摘要 |
PROBLEM TO BE SOLVED: To provide a method for sensitively, conveniently and inexpensively evaluating a superconductive film. SOLUTION: The superconductive film 1 is fixed to a scale 2. A cooling medium 4 is placed in a container 3. The superconductive film 1 is cooled and comes into a superconductive state. While a magnet 5 gradually falls, the scale 2 measures a force applied to the superconductive film 1. A distance Z between the superconductive film 1 and the magnet 5 is measured when a repulsive force changes to an attractive force. When magnetic field strength applied to the superconductive film 1 reaches a lower critical magnetic field H<SB>c1</SB>, a magnetic flux enters into the superconductive film 1. When the magnetic flux enters the superconductive film 1, the attractive force acts on the superconductive film 1 and the magnet 5. The superconductive film with an excellent superconductive property has the small distance Z. COPYRIGHT: (C)2004,JPO&NCIPI
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申请公布号 |
JP2004212168(A) |
申请公布日期 |
2004.07.29 |
申请号 |
JP20020381028 |
申请日期 |
2002.12.27 |
申请人 |
NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL & TECHNOLOGY;JAPAN SCIENCE & TECHNOLOGY AGENCY |
发明人 |
ATHINARAYANAN SUNDARESAN;TANAKA KOSUKE;OSHIMA SHIGETOSHI;KUSUNOKI MASANOBU |
分类号 |
G01R33/12;G01N27/72;H01B12/06;H01B13/00;H01L39/00;(IPC1-7):G01N27/72 |
主分类号 |
G01R33/12 |
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