发明名称 APPARATUS FOR REMOVING PARTICLES FROM BACK SURFACE OF WAFER WITH ELECTROSTATIC PLATE
摘要 PURPOSE: A particle removal apparatus is provided to absorb particles from a back surface of a wafer and prevent contamination of a wafer chuck by installing an electrostatic plate on a wafer transferring path. CONSTITUTION: An electrostatic plate(10) is used for generating static electricity according to a supply voltage. A plurality of photo sensors(12a,12b) are arranged at both sides of the electrostatic plate in order to sense the presence of wafers. A power supply is used for providing the supply voltage to generate the static electricity. A controller is used for controlling the supply voltage applied to the electrostatic plate according to input signals of the photo sensors. A manual switch is used for preventing the supply voltage applied to the electrostatic plate while the electrostatic plate is cleaned.
申请公布号 KR100443523(B1) 申请公布日期 2004.07.28
申请号 KR19970067785 申请日期 1997.12.11
申请人 HYNIX SEMICONDUCTOR INC. 发明人 YOO, JUNG JAE;JI, YONG HO
分类号 H01L21/304;(IPC1-7):H01L21/304 主分类号 H01L21/304
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