发明名称 |
APPARATUS FOR REMOVING PARTICLES FROM BACK SURFACE OF WAFER WITH ELECTROSTATIC PLATE |
摘要 |
PURPOSE: A particle removal apparatus is provided to absorb particles from a back surface of a wafer and prevent contamination of a wafer chuck by installing an electrostatic plate on a wafer transferring path. CONSTITUTION: An electrostatic plate(10) is used for generating static electricity according to a supply voltage. A plurality of photo sensors(12a,12b) are arranged at both sides of the electrostatic plate in order to sense the presence of wafers. A power supply is used for providing the supply voltage to generate the static electricity. A controller is used for controlling the supply voltage applied to the electrostatic plate according to input signals of the photo sensors. A manual switch is used for preventing the supply voltage applied to the electrostatic plate while the electrostatic plate is cleaned.
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申请公布号 |
KR100443523(B1) |
申请公布日期 |
2004.07.28 |
申请号 |
KR19970067785 |
申请日期 |
1997.12.11 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
YOO, JUNG JAE;JI, YONG HO |
分类号 |
H01L21/304;(IPC1-7):H01L21/304 |
主分类号 |
H01L21/304 |
代理机构 |
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主权项 |
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地址 |
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