发明名称 Method of manufacturing a flip-chip semiconductor device with a stress-absorbing layer made of thermosetting resin
摘要 In a flip-chip type semiconductor device, a plurality of pad electrodes are formed on a semiconductor substrate. An insulating stress-absorbing resin layer made of thermosetting resin is formed on the semiconductor substrate and has openings corresponding to the pad electrodes. A plurality of flexible conductive members are filled in the openings. A plurality of metal bumps are formed on the flexible conductive layers.
申请公布号 US6767761(B2) 申请公布日期 2004.07.27
申请号 US20030686568 申请日期 2003.10.17
申请人 NEC ELECTRONICS CORPORATION 发明人 HONDA HIROKAZU
分类号 H01L23/52;H01L21/3205;H01L21/56;H01L21/60;H01L23/12;H01L23/29;H01L23/31;H01L23/485;(IPC1-7):H01L21/44;H01L21/48;H01L21/50 主分类号 H01L23/52
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