发明名称 Method and device for reducing a number of measured values of a technical system
摘要 A method and system for screening out empirically data collected from various steps of a technical process operating based on a first set of parameters, by utilizing a screening algorithm to reduce the size of the empirical data set, thus improving the modeling and revising of the technical process. The algorithm utilizes various classes associated with the empirical values and within each class performs an assessment with respect to preselected threshold values. The algorithm also performs an assessment with respect to another preselected threshold value, for the class as a whole.
申请公布号 US6768972(B1) 申请公布日期 2004.07.27
申请号 US20010857481 申请日期 2001.06.04
申请人 SIEMENS AKTIENGESESELLSCHAFT 发明人 SCHAEFFLER STEFAN;STURM THOMAS
分类号 G05B23/02;(IPC1-7):G06F15/00 主分类号 G05B23/02
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