发明名称 Semiconductor laser device and method for fabricating the same
摘要 A method for fabricating a buried semiconductor laser device including the steps of: forming a mesa structure including a bottom cladding layer, an active layer and a top cladding layer overlying an n-type semiconductor substrate; and forming a current confinement structure by growing a p-type current blocking layer and an n-type current blocking layer on each side surface of the mesa structure and on a skirt portion extending from the each side surface, the p-type current blocking layer being fabricated by using a raw material gas containing a group III element gas and a group V element gas at a molar ratio between 60 and 350 inclusive. In this method, the semiconductor laser device including the current confinement structure with the specified leakage current path width can be fabricated with the excellent reproducibility.
申请公布号 US6768759(B2) 申请公布日期 2004.07.27
申请号 US20010997306 申请日期 2001.11.28
申请人 THE FURUKAWA ELECTRIC CO., LTD. 发明人 HONKAWA YUKIO;ONO TAKAHIRO;HATTORI SATOSHI;SATO YOSHIHIRO
分类号 H01S5/22;H01S5/227;H01S5/323;(IPC1-7):H01S5/22 主分类号 H01S5/22
代理机构 代理人
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