发明名称 Method of Production of a thin film type semiconductor device having a heat-retaining layer
摘要 An operating semiconductor layer is formed in such a manner that amorphous silicon layer is formed to be shaped so that it has a wide region and a narrow region and the narrow region is connected to the wide region at a position asymmetric to the wide region, and the amorphous silicon layer is crystallized by scanning a CW laser beam from the wide region toward the narrow region in a state that a polycrystalline silicon layer as a heat-retaining layer encloses the narrow region from a side face through the silicon oxide layer.
申请公布号 US6767773(B2) 申请公布日期 2004.07.27
申请号 US20020230161 申请日期 2002.08.29
申请人 FUJITSU LIMITED 发明人 SANO YASUYUKI;HARA AKITO;TAKEI MICHIKO;SASAKI NOBUO
分类号 H01L21/20;H01L21/336;H01L29/786;(IPC1-7):H01L21/00;H01L21/331;H01L21/76;H01L21/302 主分类号 H01L21/20
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