| 摘要 |
When a first transistor for switching Tr1 is ON by a gate signal, a voltage signal in accordance with a data voltage signal input to the source terminal of the first transistor Tr1 is held in a storage capacitor. A second transistor Tr2 controls an amount of current supplied to an emissive element from a power source line PVdd in accordance with the voltage signal, and a charge is accumulated in an additional capacitor C2 in accordance with the amount of current thus controlled. Defect inspection corresponding to the actual display state can be performed by examining the charge accumulated in the additional capacitor C2.
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