发明名称 Method of fabricating a gate structure of a field effect transistor using an alpha-carbon mask
摘要 A method of fabricating a gate structure of a field effect transistor comprising processes of forming an alpha-carbon mask and plasma etching a gate electrode and a gate dielectric using the alpha-carbon mask. In one embodiment, the gate dielectric comprises hafnium dioxide.
申请公布号 US6767824(B2) 申请公布日期 2004.07.27
申请号 US20030338251 申请日期 2003.01.06
申请人 NALLAN PADMAPANI C.;KUMAR AJAY;JIN GUANGXIANG;LIU WEI 发明人 NALLAN PADMAPANI C.;KUMAR AJAY;JIN GUANGXIANG;LIU WEI
分类号 H01L21/027;H01L21/28;H01L21/311;H01L21/3213;(IPC1-7):H01L21/476;H01L21/320 主分类号 H01L21/027
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