发明名称 Non-volatile semiconductor memory device
摘要 A NOR-type flash memory device includes a global decoder circuit that is coupled to global wordlines. The global decoder circuit drives the global wordlines using wordline voltages that will be applied to local wordlines in each operation mode, and has wordline select switches each corresponding to the global wordlines. A local decoder circuit couples the local wordlines to the global wordlines in response to a sector select signal, and a sector generates a control signal in accordance with address information for selecting a memory cell array. A switch circuit includes a plurality of depletion MOS transistors each being coupled between corresponding first and second wordline. The depletion MOS transistors are commonly controlled by a control signal. Each of the wordline select switches is made of two NMOS transistors.
申请公布号 US6768674(B2) 申请公布日期 2004.07.27
申请号 US20020231602 申请日期 2002.08.29
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 PARK DONG-HO
分类号 G11C16/06;G11C16/04;G11C16/08;G11C29/00;G11C29/04;(IPC1-7):G11C16/04 主分类号 G11C16/06
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