发明名称 ROM embedded DRAM with bias sensing
摘要 A ROM embedded DRAM that provides ROM cells that can be programmed to a single state. Bias techniques are used to read un-programmed ROM cells accurately. Sense amplifier circuitry can be offset in one embodiment to default to the un-programmed state. In another embodiment, bias circuitry is coupled to bit lines to favor the un-programmed state. Further, a differential pre-charge operation can also be used in another embodiment. The ROM embedded DRAM allows for simplifier fabrication and programming of the ROM cells, while providing accurate dual state functionality.
申请公布号 US6768664(B2) 申请公布日期 2004.07.27
申请号 US20030376730 申请日期 2003.02.28
申请人 MICRON TECHNOLOGY, INC. 发明人 DERNER SCOTT;KURTH CASEY;WALD PHILLIP G.
分类号 G11C7/06;G11C7/14;G11C17/12;G11C17/18;(IPC1-7):G11C17/00;G11C16/06 主分类号 G11C7/06
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