发明名称 CHIP SCALE MARKER AND MARKING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a chip scale marker capable of giving laser marking quickly and precisely by removing a warp of a wafer. SOLUTION: The chip scale marker includes wafer chucking vacuum plate (130) at the center of a wafer holder (120) and a wafer rotating means on the surroundings of the vacuum plate (130), where a part of a region facing a laser system (100) is disclosed and a warp removal means (170) to remove the warp from the wafer is provided on such area that the wafer holder (120) is not opened. Thereby, marking quality can be improved by extending the wafer having the warp before wafer marking to individually position wafer chips at a fixed marking distance from the laser system (100) and then give the marking. COPYRIGHT: (C)2004,JPO&NCIPI
申请公布号 JP2004207683(A) 申请公布日期 2004.07.22
申请号 JP20030330484 申请日期 2003.09.22
申请人 EO TECHNICS CO LTD 发明人 HAN YOU HIE;JUN CHANG SU
分类号 H01L21/02;B23K26/08;H01L21/00;H01L23/544;(IPC1-7):H01L21/02 主分类号 H01L21/02
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