发明名称 SOI SUBSTRATE AND SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
摘要 PROBLEM TO BE SOLVED: To provide an SOI substrate and a semiconductor integrated circuit device which do not require a dedicated region where a structure for reducing noises, such as a decoupling capacitor, and guard ring, is arranged. SOLUTION: A p<SP>-</SP>-type silicon support substrate 2 is provided, a p<SP>+</SP>-type silicon layer 3 is provided on the support substrate 2, and n<SP>+</SP>-type silicon layers 4 and p<SP>+</SP>-silicon layers 12 are alternately formed thereon. The p+-type silicon layer 3 and the n<SP>+</SP>-type silicon layers 4 are set higher in impurity concentration than the support substrate 2. A buried oxide film 5 and an SOI layer 6 are provided on all the surfaces of the n<SP>+</SP>-type silicon layers 4 and the p<SP>+</SP>-silicon layers 12. The p<SP>+</SP>-silicon layer 3 is connected to a grounding potential interconnect line GND, and the n<SP>+</SP>-type silicon layers 4 are connected to a power supply potential interconnect line VDD. By this setup, the decoupling capacitor C1 connected to a power supply in parallel is provided between the p<SP>+</SP>-type silicon layer 3 and the n<SP>+</SP>-type silicon layers 4. COPYRIGHT: (C)2004,JPO&NCIPI
申请公布号 JP2004207271(A) 申请公布日期 2004.07.22
申请号 JP20020370971 申请日期 2002.12.20
申请人 NEC ELECTRONICS CORP 发明人 OKUBO HIROAKI;FURUMIYA MASAYUKI;YAMAMOTO RYOTA;NAKASHIBA YASUTAKA
分类号 H01L21/762;H01L21/02;H01L21/3205;H01L21/76;H01L21/822;H01L21/84;H01L23/52;H01L27/01;H01L27/04;H01L27/12;(IPC1-7):H01L27/12;H01L21/320 主分类号 H01L21/762
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