| 摘要 |
PROBLEM TO BE SOLVED: To reduce the area increase by reducing the number of flip-flops in a semiconductor device testing a memory. SOLUTION: The flip-flop for a pipe line in memory BIST (Built-In Self-Test) in the semiconductor device shares with the flip-flop for scan observation and/or the flip-flop for scan control. By this share, the number of flip-flops is reduced for area saving. COPYRIGHT: (C)2004,JPO&NCIPI
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