发明名称 Semiconductor with tensile strained substrate and method of making the same
摘要 An exemplary embodiment relates to a method for forming a metal oxide semiconductor field effect transistor (MOSFET). The method includes providing a substrate having a gate formed above the substrate and performing at least one of the following depositing steps: depositing a spacer layer and forming a spacer around a gate and gate insulator located above a layer of silicon above the substrate; depositing an etch stop layer above the spacer, the gate, and the layer of silicon; and depositing a dielectric layer above the etch stop layer. At least one of the depositing a spacer layer, depositing an etch stop layer, and depositing a dielectric layer comprises high compression deposition which increases in tensile strain in the layer of silicon.
申请公布号 US2004142545(A1) 申请公布日期 2004.07.22
申请号 US20030346617 申请日期 2003.01.17
申请人 ADVANCED MICRO DEVICES, INC. 发明人 NGO MINH V.;BESSER PAUL R.;LIN MING REN;WANG HAIHONG
分类号 H01L29/10;(IPC1-7):H01L21/320 主分类号 H01L29/10
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