发明名称 |
DOUBLE-GATE TYPE FIELD EFFECT TRANSISTOR AND ITS MANUFACTURING METHOD |
摘要 |
PROBLEM TO BE SOLVED: To provide a method of manufacturing a double-gate type field effect transistor (DGFET) of a self-aligning planar type with a front gate and a back gate aligned. SOLUTION: A method of manufacturing this double-gate type field effect transistor (DGFET) comprises: a process of preparing a stacked double-gate structure provided with at least a back gate 14, a back gate dielectric provided on the back gate 14, a channel layer provided on the back gate dielectric, a front gate dielectric provided on the channel layer, and a front gate 22 provided on the front gate dielectric; a process of patterning the front gate 22 of the stacked double-gate structure; a process of forming a sidewall spacer on the exposed sidewall of the pattered front gate 22; and a process of forming a carrier depletion zone at a part of the back gate and allowing the carrier depletion zone to align the back gate to the front gate. COPYRIGHT: (C)2004,JPO&NCIPI
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申请公布号 |
JP2004207705(A) |
申请公布日期 |
2004.07.22 |
申请号 |
JP20030409571 |
申请日期 |
2003.12.08 |
申请人 |
INTERNATL BUSINESS MACH CORP <IBM> |
发明人 |
DOKUMACI OMER H;DORIS BRUCE B;HEGDE SURYANARAYAN G;IEONG MEIKEI;JONES ERIN C |
分类号 |
H01L21/265;H01L21/336;H01L21/337;H01L29/423;H01L29/49;H01L29/786;H01L29/80;(IPC1-7):H01L29/786 |
主分类号 |
H01L21/265 |
代理机构 |
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代理人 |
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地址 |
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