| 摘要 |
PROBLEM TO BE SOLVED: To provide a substrate design method and substrate design support device capable of easily determining a substrate specification by use of a regression equation. SOLUTION: A substrate sectional structure value is inputted to the regression equation formed on the basis of the relation between a measured value of substrate characteristic impedance and a measured value of substrate sectional structure, whereby a characteristic impedance Zo of the substrate is calculated. An intended characteristic impedance Zo of the substrate is inputted to the same regression equation, whereby the substrate sectional structure value is calculated. COPYRIGHT: (C)2004,JPO&NCIPI
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