发明名称 |
GATE ELECTRODE AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE WITH THE SAME |
摘要 |
PURPOSE: A gate electrode and a method for manufacturing a semiconductor device with the same are provided to prevent the formation of a silicon oxide layer between conductive layers by using a reaction barrier layer containing Ge. CONSTITUTION: The first conductive layer(23) containing silicon is formed on a semiconductor substrate(21). The first reaction barrier layer(24a) containing Ge is formed on the first conductive layer. The second reaction barrier layer(25) containing N2 is formed on the first reaction barrier layer. The second metallic conductive layer(26) is formed on the second reaction barrier layer.
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申请公布号 |
KR20040065336(A) |
申请公布日期 |
2004.07.22 |
申请号 |
KR20030002195 |
申请日期 |
2003.01.13 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
CHO, HEUNG JAE;LEE, JEONG HO;LIM, GWAN YONG |
分类号 |
H01L29/78;(IPC1-7):H01L29/78 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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