AN EXTRACTOR FOR AN MICROCOLOUM, AN ALIGNMENT METHOD FOR AN EXTRACTOR APERTURE TO AN ELECTON EMITTER, AND A MEASURING METHOD AND AN ALIGNMENT METHOD USING THEREOF,申请号AU20030289574-传众专利搜索

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发明名称	AN EXTRACTOR FOR AN MICROCOLOUM, AN ALIGNMENT METHOD FOR AN EXTRACTOR APERTURE TO AN ELECTON EMITTER, AND A MEASURING METHOD AND AN ALIGNMENT METHOD USING THEREOF
摘要
申请公布号	AU2003289574(A1)	申请公布日期	2004.07.22
申请号	AU20030289574	申请日期	2003.12.30
申请人	CEBT CO., LTD.	发明人	SEUNG JOON AHN;DAE WOOK KIM;HO SEOB KIM
分类号	G03F9/00;H01J3/02;H01J3/10;H01J37/06;H01J37/067;H01J37/15;(IPC1-7):H01J37/06	主分类号	G03F9/00
代理机构		代理人
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