发明名称 LENS MEASURING INSTRUMENT
摘要 PROBLEM TO BE SOLVED: To provide a lens measuring instrument for measuring a lens to be inspected with a measurement optical system having a target plate having a microlens or a pin hole and speedily indicating with frequency distribution using a components with simpler structure. SOLUTION: An image of light flux having passed a lens to be inspected and a microlens provided in a target plate is photographed, and the direction vector of the light flux having passed each microlens by taking matched relation between each light flux image and each microlens provided in the target plate is calculated. By using the direction vector of the light flux corresponding to the microlenses at a plurality of close locations in the arbitrarily set region of the lens, complementing operations are conducted to calculate the frequency corresponding arbitrary locations of the lens to be inspected. COPYRIGHT: (C)2004,JPO&NCIPI
申请公布号 JP2004205438(A) 申请公布日期 2004.07.22
申请号 JP20020377526 申请日期 2002.12.26
申请人 HITACHI KOKUSAI ELECTRIC INC 发明人 KOBAYASHI MICHIHIRO
分类号 G01M11/02;(IPC1-7):G01M11/02 主分类号 G01M11/02
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