Novel medicament compositions on the basis of anti-cholinergics and PDE IV inhibitors.

摘要

Arrangement for testing an integrated circuit (1) using a data value generator (2) that generates deterministic data values with means (3-6) for test pattern generation, which change the deterministic data values so that a preset deterministic test pattern can be supplied to the inputs of the circuit under test. Comparison means (12) are used to compare the output from the circuit under test with a design output pattern, with the arrangement external to the circuit under test. An Independent claim is made for a method for testing an integrated circuit using an external test arrangement. The data value generator is a back-coupled shift register, while bit flipping controller and bit-flipping logic units are used for test pattern generation.