发明名称 METHOD FOR FORMING BIT LINE OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for forming a bit line of a semiconductor device is provided to reduce contact resistance and to improve contact filling property by using a ruthenium thin film as the bit line. CONSTITUTION: An interlayer dielectric(12) is formed on a semiconductor substrate(10) with a lower conductive layer. A bit line contact hole is formed by selectively etching the interlayer dielectric. A barrier metal film(14) is formed on the bit line contact hole. A Ru thin film(15) as a bit line is deposited to fill the bit line contact hole by CVD(Chemical Vapor Deposition).
申请公布号 KR20040065421(A) 申请公布日期 2004.07.22
申请号 KR20030002386 申请日期 2003.01.14
申请人 HYNIX SEMICONDUCTOR INC. 发明人 LEE, JU WAN
分类号 H01L21/28;(IPC1-7):H01L21/28 主分类号 H01L21/28
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