| 摘要 |
A test handling apparatus for supplying electronic devices to a tester for testing comprises a tester interface for communicating with the tester; at least two device interfaces each of which is connectable to the tester interface through a first connection, and each of which is connectable to a corresponding group of electronic devices through a second connection, one of the first and the second connections is alternately connectable. A corresponding method comprises connecting a first group of electronic devices to a tester interface for testing; disconnecting the first group of electronic devices from the tester interface upon completion of the testing; connecting a second group of electronic devices to the tester interface for testing and disconnecting the second group of electronic devices from the tester interface upon completion of the testing. Higher operation throughput can be obtained without substantially increasing the speed of a handler.
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