发明名称 Atomic layer deposition of CMOS gates with variable work functions
摘要 According to one aspect, a CMOS device includes a PMOS transistor and an NMOS transistor, where each transistor includes a source, a drain, a channel region between the source and the drain, and a gate separated from the channel region by a gate insulator. The gate of the PMOS transistor includes a metallic conductor formed by atomic layer deposition and engineered to provide the gate with a first composition having a first work function. The gate of the NMOS transistor includes a metallic conductor formed by atomic layer deposition and engineered to provide the gate with a second composition having a second work function such that the NMOS transistor and the PMOS transistor have threshold voltages of approximately the same magnitude. At least one of the gates includes a ternary metal conductor formed by atomic layer deposition.
申请公布号 US2004140513(A1) 申请公布日期 2004.07.22
申请号 US20040754842 申请日期 2004.01.09
申请人 MICRON TECHNOLOGY, INC. 发明人 FORBES LEONARD;AHN KIE Y.
分类号 H01L21/28;H01L21/285;H01L21/8238;H01L27/092;H01L27/10;H01L29/423;H01L29/49;H01L29/78;(IPC1-7):H01L29/76 主分类号 H01L21/28
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