发明名称 Adjusting x-ray tube focal spot position involves measuring spot position signal, generating deflection signal depending on position signal, applying deflection signal to electron beam deflector
摘要 The method involves regulating the position of the focal spot (11) as the control parameter in a control loop. A focal spot position signal is measured, a deflection signal is generated depending on the focal spot position signal and the deflection signal is applied to a deflection device (9) for deflecting an electron beam (7) in the x-ray tube. AN Independent claim is also included for the following: (a) an arrangement for adjusting the focal spot position of an x-ray tube.
申请公布号 DE10301071(A1) 申请公布日期 2004.07.22
申请号 DE20031001071 申请日期 2003.01.14
申请人 SIEMENS AG 发明人 DEURINGER, JOSEF;ZEISKE, KARSTEN;GURTNER, ROLF
分类号 H01J35/14;H05G1/52;(IPC1-7):H05G1/30 主分类号 H01J35/14
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