发明名称 |
Adjusting x-ray tube focal spot position involves measuring spot position signal, generating deflection signal depending on position signal, applying deflection signal to electron beam deflector |
摘要 |
The method involves regulating the position of the focal spot (11) as the control parameter in a control loop. A focal spot position signal is measured, a deflection signal is generated depending on the focal spot position signal and the deflection signal is applied to a deflection device (9) for deflecting an electron beam (7) in the x-ray tube. AN Independent claim is also included for the following: (a) an arrangement for adjusting the focal spot position of an x-ray tube.
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申请公布号 |
DE10301071(A1) |
申请公布日期 |
2004.07.22 |
申请号 |
DE20031001071 |
申请日期 |
2003.01.14 |
申请人 |
SIEMENS AG |
发明人 |
DEURINGER, JOSEF;ZEISKE, KARSTEN;GURTNER, ROLF |
分类号 |
H01J35/14;H05G1/52;(IPC1-7):H05G1/30 |
主分类号 |
H01J35/14 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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