发明名称 |
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for manufacturing a semiconductor device is provided to restrain diffusion of dopants by using low-temperature processing and to reduce contact resistance by increasing the area of a plug contact. CONSTITUTION: A gate line(160) is formed by sequentially stacking and patterning an insulating layer(110), a conductive layer(120) and a hard mask(130) on a silicon substrate(100). A source/drain region(165) is formed in the substrate. An oxide layer(170) is formed on the resultant structure by PECVD(Plasma Enhanced CVD) under low-temperature. A nitride layer(180) as a spacer is formed on the oxide layer. An interlayer dielectric(190) is then formed on the resultant structure.
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申请公布号 |
KR20040065031(A) |
申请公布日期 |
2004.07.21 |
申请号 |
KR20030002150 |
申请日期 |
2003.01.13 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
BAEK, JEONG GWON;KIM, DONG HWAN |
分类号 |
H01L21/336;(IPC1-7):H01L21/336 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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