发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for manufacturing a semiconductor device is provided to restrain diffusion of dopants by using low-temperature processing and to reduce contact resistance by increasing the area of a plug contact. CONSTITUTION: A gate line(160) is formed by sequentially stacking and patterning an insulating layer(110), a conductive layer(120) and a hard mask(130) on a silicon substrate(100). A source/drain region(165) is formed in the substrate. An oxide layer(170) is formed on the resultant structure by PECVD(Plasma Enhanced CVD) under low-temperature. A nitride layer(180) as a spacer is formed on the oxide layer. An interlayer dielectric(190) is then formed on the resultant structure.
申请公布号 KR20040065031(A) 申请公布日期 2004.07.21
申请号 KR20030002150 申请日期 2003.01.13
申请人 HYNIX SEMICONDUCTOR INC. 发明人 BAEK, JEONG GWON;KIM, DONG HWAN
分类号 H01L21/336;(IPC1-7):H01L21/336 主分类号 H01L21/336
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