发明名称 |
A controller for implementing scan testing |
摘要 |
<p>A test access port controller is provided for implementing scan testing with a chain of scan latches on an integrated circuit. The test access port controller can implement a structural test or a performance test. Selection between the two types of test is achieved through logic circuitry of the test access port controller. An integrated circuit and a test system are also provided. <IMAGE></p> |
申请公布号 |
EP0702239(B1) |
申请公布日期 |
2004.07.21 |
申请号 |
EP19950305859 |
申请日期 |
1995.08.22 |
申请人 |
STMICROELECTRONICS LIMITED |
发明人 |
WARREN, ROBERT |
分类号 |
G01R31/28;G01R31/3185;G06F11/22;(IPC1-7):G01R31/317;G06F11/24;G06F11/267;G01R31/318 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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