SEMICONDUCTOR MEMORY DEVICE HAVING BURN-IN TEST FUNCTION

摘要

PURPOSE: A semiconductor memory device having a burn-in test function is provided to screen each bad state of a column selection line and an input/output line by applying the stress for the column selection line and the input/output line in a burn-in test. CONSTITUTION: A semiconductor memory device having a burn-in test function includes a plurality memory cells, a row line selector, a column line selector, a column address coding unit(50), and a column selection line enabling unit. The row line selector and the column line selector are used for selecting particular cells from the memory cells. The column selection line enabling unit is connected to an output terminal of the column address coding unit in order to generate a signal for enabling a column line selection unit after a bit line sensing process in a read operation of a burn-in test.