发明名称 WAFER FIXING APPARATUS FOR SCRATCH TESTER TO QUICKLY AND SIMPLY TEST WAFERS OF VARIOUS SIZES WITHOUT REPLACING TABLE
摘要 PURPOSE: A wafer fixing apparatus for a scratch tester is provided to quickly and simply test wafers of various sizes without replacing a table by easily fixing and separating the wafers regardless of the size of the wafer. CONSTITUTION: A table(10) has a support surface(11) to which the bottom surface of a wafer(W) is closely attached. The first fixing member(20) fixes the flat zone of the wafer, installed in a side of the support surface. At least one of the second fixing member(30) is installed to be transferred and fixed along the long hole(12) formed in the table and fixes/unfixes the round zone of the wafer, correspondingly disposed in a position opposite to the first fixing member.
申请公布号 KR100442455(B1) 申请公布日期 2004.07.21
申请号 KR20040007588 申请日期 2004.02.05
申请人 GRAND TECH CO., LTD. 发明人 OH, HEE GEUN
分类号 H01L21/68;(IPC1-7):H01L21/68 主分类号 H01L21/68
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