发明名称 X-ray fluorescence analyzer
摘要 An x-ray fluorescence analyzer and method. The analyzer and method use a single radio-active source, such as, <241>Am to determine the composition of a metal alloy or precious metal. The method compensates for Rayleigh scattering by first determining a scaling factor using a particular energy line in the spectrum of the test material and comparing that line to the same energy line for a pure metal. Based on the scaling factor the energy spectrum for the pure is compensated and then subtracted from the energy spectrum of the test material at discrete points.
申请公布号 US6765986(B2) 申请公布日期 2004.07.20
申请号 US20020067683 申请日期 2002.02.04
申请人 NITON CORP 发明人 GRODZINS LEE;GRODZINS HAL
分类号 G01N23/203;G01N23/223;G01N23/225;(IPC1-7):G01N23/223 主分类号 G01N23/203
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