发明名称 |
X-ray fluorescence analyzer |
摘要 |
An x-ray fluorescence analyzer and method. The analyzer and method use a single radio-active source, such as, <241>Am to determine the composition of a metal alloy or precious metal. The method compensates for Rayleigh scattering by first determining a scaling factor using a particular energy line in the spectrum of the test material and comparing that line to the same energy line for a pure metal. Based on the scaling factor the energy spectrum for the pure is compensated and then subtracted from the energy spectrum of the test material at discrete points.
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申请公布号 |
US6765986(B2) |
申请公布日期 |
2004.07.20 |
申请号 |
US20020067683 |
申请日期 |
2002.02.04 |
申请人 |
NITON CORP |
发明人 |
GRODZINS LEE;GRODZINS HAL |
分类号 |
G01N23/203;G01N23/223;G01N23/225;(IPC1-7):G01N23/223 |
主分类号 |
G01N23/203 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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