发明名称 Method and apparatus for dynamically enabling trace data collection
摘要 A method includes identifying a degraded condition associated with the processing of a workpiece. At least one process tool associated with the degraded condition is identified. Trace data collection is enabled for the identified process tool. A system includes a processing system configured to process a workpiece and a tool monitor. The tool monitor is configured to identify a degraded condition associated with the processing of the workpiece, identify at least one process tool from the processing system associated with the degraded condition, and enable trace data collection for the identified process tool.
申请公布号 US6766258(B1) 申请公布日期 2004.07.20
申请号 US20020160933 申请日期 2002.05.31
申请人 ADVANCED MICRO DEVICES, INC. 发明人 STEWART EDWARD C.;HICKEY SUSAN
分类号 H01L21/66;(IPC1-7):G01B5/28 主分类号 H01L21/66
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