发明名称 Identifying relationships among constituent parts of a wafer fabrication system
摘要 A method and system for use in wafer fabrication systems. The method and system identify relationships among constituent parts of a wafer fabrication system by generating a presentation of at least one relationship between an identified at least one integral part associated with the wafer fabrication system and at least one other integral part associated with the wafer fabrication system.
申请公布号 US6766212(B1) 申请公布日期 2004.07.20
申请号 US19990352984 申请日期 1999.07.14
申请人 NEC ELECTRONICS, INC. 发明人 DEAN TIMOTHY C.
分类号 G03F7/20;G06F19/00;H01L21/00;(IPC1-7):G06F19/00 主分类号 G03F7/20
代理机构 代理人
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