发明名称 |
NON-VOLATILE MEMORY DEVICE WITH CHARGE STORAGE INSULATION LAYER AND FABRICATING METHOD THEREOF |
摘要 |
PURPOSE: A non-volatile memory device with a charge storage insulation layer is provided to prevent damage to a semiconductor substrate while a contact hole or a groove is formed by making the uppermost layer of the charge storage insulation layer formed of a metal oxide layer and by patterning an interlayer dielectric while using the metal oxide layer as an etch stop layer. CONSTITUTION: A cell region is defined in a semiconductor substrate. A plurality of parallel trench isolation layers(STI) are formed in the cell region, defining active regions. A charge storage insulation layer(74c) is conformally formed on the active regions and the isolation layers. A plurality of parallel wordlines(w1-wn) cross the upper part of the active regions, formed on the charge storage insulation layer. Conductive patterns penetrate the charge storage insulation layer to be electrically connected to the active region, disposed between the wordlines.
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申请公布号 |
KR20040064339(A) |
申请公布日期 |
2004.07.19 |
申请号 |
KR20030001566 |
申请日期 |
2003.01.10 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
LEE, CHANG HYEON |
分类号 |
H01L27/10;H01L21/336;H01L21/8246;H01L21/8247;H01L27/105;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):H01L27/115 |
主分类号 |
H01L27/10 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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