发明名称 |
METHOD FOR RESTRAINING HILLOCK OF ALUMINUM WIRING IN THERMAL PRINT HEAD |
摘要 |
PURPOSE: A method for restraining hillock of an aluminum wiring in a TPH(Thermal Print Head) is provided to prevent hillock by previously forming a common wiring layer before forming a wiring layer. CONSTITUTION: A common wiring layer is selectively formed on a base substrate in order to restrain hillock seed(S11). A wiring layer is then formed on the base substrate including the common wiring layer(S13). Wiring patterns are formed by patterning the wiring layer(S15). A passivation layer is formed on the wiring patterns so as to restrain hillock seed under the low temperature of 100°C(S17).
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申请公布号 |
KR100441840(B1) |
申请公布日期 |
2004.07.16 |
申请号 |
KR19960037178 |
申请日期 |
1996.08.30 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
PARK, JU HA |
分类号 |
H01L21/28;(IPC1-7):H01L21/28 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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